• Quantification of van der Waals forces in bimodal and trimodal AFM 

      Santos Hernandez, Sergio; Gadelrab, Karim; Elsherbiny, Lamiaa; Drexler, Xaver; Olukan, Tuza Adeyemi; Font, Josep; Barcons, Victor; Chiesa, Matteo (Journal article; Tidsskriftartikkel; Peer reviewed, 2023-05-22)
      The multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The multifrequency force spectroscopy formalism with higher modes, including trimodal AFM, can outperform bimodal AFM for material property quantification. Bimodal AFM with the second ...